X-ray diffraction (XRD)
The phase composition of the alloy was analyzed by X-ray diffractometer. The model of the diffractometer was D / max 2550v, the accelerating voltage was 40kV, the scanning speed was 4 ° / min, and the scanning range was 20 ~ 80 ℃. The XRD results were analyzed by the crystallographic software jade 6.0, and the phase was calibrated by comparing the standard powder sample card (PDF card) with the XRD pattern.
The microstructure and fracture morphology of the alloy were observed by scanning electron microscope (SEM: jeol jsm-7800f prime and phenom XL), and the micro composition of the sample was analyzed by energy dispersive X-ray (EDX). The sample preparation of SEM is the same as that of metallography.
The microstructure of T6 alloy was observed by transmission electron microscopy (TEM, jeol 2100f). The working voltage of TEM is 200kV. The preparation process of TEM sample is as follows: firstly, the T6 alloy sheet with a thickness of 0.5 mm is obtained by wire cutting, then the alloy sheet is manually ground to about 90 μ m on 300, 800 and 3000 sandpaper in turn, and then the sheet is punched into a φ 3 mm disc. Finally, the disc was treated by dual jet electrolysis instrument (tenupol-5). The electrolysis solution was 4 vol.% perchloric acid alcohol solution. The temperature was controlled at – 30 ℃ by liquid nitrogen and the working voltage was 30 v.
According to Archimedes principle, the density of the alloy was measured by eds-300 density analytical balance. The mass of the tested sample was less than 50g, and the density test result was the average of the five measurement results.